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MOSFETs: With insight & intuition...

Independently published
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9781077888210
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ISBN13:
9781077888210
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This 61-page handbook uses insight to explain how metal-oxide-semiconductor (MOS) field-effect transistors (FETs) block and conduct current in sub-threshold, weak inversion, and inversion. It describes how MOSFETs accumulate, deplete, and invert their channels and how they saturate their currents in sub-threshold and inversion. It also discusses body effect, how gate-channel oxide capacitance distributes across operating regions, and short-channel effects, like drain-induced barrier lowering (DIBL), surface scattering, hot-electron injection, oxide-surface ejections, velocity saturation, and impact ionization and avalanche. Discussions extend to varactors, MOS diodes, lightly doped drains (LDD), diffused-channel MOSFETs (DMOS), junction isolation, substrate MOSFETs, welled MOSFETs, and electronic and systemic noise coupling and injection. Illustrative figures, equations, and examples complement discussions throughout.


  • | Author: Gabriel Alfonso Rinc�n-Mora
  • | Publisher: Independently published
  • | Publication Date: July 03, 2019
  • | Number of Pages: 76 pages
  • | Language: English
  • | Binding: Paperback
  • | ISBN-10: 107788821X
  • | ISBN-13: 9781077888210
Author:
Gabriel Alfonso Rinc�n-Mora
Publisher:
Independently published
Publication Date:
July 03, 2019
Number of pages:
76 pages
Language:
English
Binding:
Paperback
ISBN-10:
107788821X
ISBN-13:
9781077888210