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2 results for 'Manoj Sachdev'

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  • Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Paperback
    $231.01
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  • Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Hardback
    $231.01
    View product
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