Overview
The Second Edition presents a state-of-the-art overview of modern microanalysis principles and applications. Revised and expanded throughout, the work covers the latest specimen preparation techniques and such new topics as lattice and atomic imaging ... electron reflection holography ... transmission electron holography ... filtered imaging in transmission electron microscopy ... scanning tunneling microscopy ... the atomic force microscope ... computed images ... and computer processing of electron microscope images. Offering more than 350 drawings and photographs, over 700 key literature references, end-of-chapter problems, and an appendix with solutions, this book is timely reading for optical, electrical, electronics, materials, environmental, and ceramic engineers; solid-state chemists and physicists; analytical chemists; materials scientists; metallurgists; and upper-level undergraduate, graduate, and continuing-education students in these disciplines. Book jacket.
- | Author: Lawrence E. Murr
- | Publisher: Crc Press
- | Publication Date: Oct 29, 2019
- | Number of Pages: 856 pages
- | Language: English
- | Binding: Paperback
- | ISBN-10: 0367402947
- | ISBN-13: 9780367402945
