Overview
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.
- | Author: Santanu Chattopadhyay
- | Publisher: Crc Press
- | Publication Date: Jun 30, 2020
- | Number of Pages: 118 pages
- | Language: English
- | Binding: Paperback
- | ISBN-10: 0367607093
- | ISBN-13: 9780367607098
