Overview

Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. It focuses on timing and power analysis techniques, developed during the past couple of years, which will lead to parametric yield analysis techniques. Optimization approaches suitable in non-deterministic scenarios which improve the yield of the design are also explained. This book comprises a valuable reference for statistical analysis and optimization techniques in current and future VLSI design for CAD-Tool developers and for researchers interested in starting work in this very active area of research. The authors have been leading a lot of the research in this area and will also provide novel ideas and approaches to handle the addressed issues.