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Semiconductor Memories: Technology, Testing, and Reliability

Semiconductor Memories: Technology, Testing, and Reliability

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Product Details
Author:
Ashok K. Sharma
Publisher:
Wiley-IEEE Press
Publication Date:
Sep 10, 2002
Number of pages:
480 pages
Binding:
Hardback or Cased Book
ISBN-10:
0780310004
ISBN-13:
9780780310001

Overview

Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage.


  • | Author: Ashok K. Sharma
  • | Publisher: Wiley-IEEE Press
  • | Publication Date: Sep 10, 2002
  • | Number of Pages: 480 pages
  • | Binding: Hardback or Cased Book
  • | ISBN-10: 0780310004
  • | ISBN-13: 9780780310001

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