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VLSI Testing: Digital and Mixed Analogue/Digital Techniques

VLSI Testing: Digital and Mixed Analogue/Digital Techniques

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Product Details
Author:
Stanley L. Hurst
Publisher:
Institution of Engineering & Technology
Publication Date:
Jun 30, 1998
Number of pages:
552 pages
Binding:
Hardback or Cased Book
ISBN-10:
0852969015
ISBN-13:
9780852969014

Overview

The importance of testing integrated circuits (ICs) has escalated with the increasing complexity of circuits fabricated on a single IC chip. No longer is it possible to design a new IC and then think about testing: such considerations must be part of the initial design activity, and testing strategies should be part of every circuit and system designer's education. This book is a comprehensive introduction and reference for all aspects of IC testing. It includes all of the basic concepts and theories necessary for advanced students, from practical test strategies and industrial practice, to the economic and managerial aspects of testing. In addition to detailed coverage of digital network testing, VLSI testing also considers in depth the growing area of testing analogue and mixed analogue/digital ICs, used particularly in signal processing.


  • | Author: Stanley L. Hurst
  • | Publisher: Institution of Engineering & Technology
  • | Publication Date: Jun 30, 1998
  • | Number of Pages: 552 pages
  • | Binding: Hardback or Cased Book
  • | ISBN-10: 0852969015
  • | ISBN-13: 9780852969014

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