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Next Generation Technology-Enhanced Assessment (Educational and Psychological Testing in a Global Context)

Next Generation Technology-Enhanced Assessment (Educational and Psychological Testing in a Global Context)

John C. Scott, Dave Bartram, Douglas H. Reynolds

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Product Details
Author:
John C. Scott, Dave Bartram, Douglas H. Reynolds
Publisher:
Cambridge University Press
Publication Date:
Jun 18, 2020
Number of pages:
422 pages
Language:
English
Binding:
Paperback
ISBN-10:
1107561531
ISBN-13:
9781107561533

Overview

  • | Author: John C. Scott, Dave Bartram, Douglas H. Reynolds
  • | Publisher: Cambridge University Press
  • | Publication Date: Jun 18, 2020
  • | Number of Pages: 422 pages
  • | Language: English
  • | Binding: Paperback
  • | ISBN-10: 1107561531
  • | ISBN-13: 9781107561533

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