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Scanning Electron Microscopy Of Plastics Failure

Scanning Electron Microscopy Of Plastics Failure

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Product Details
Author:
G. W. Ehrenstein
Publisher:
Hanser Publications
Publication Date:
Sep 01, 2010
Number of pages:
262 pages
Language:
English
Binding:
Hardcover
ISBN-10:
1569905029
ISBN-13:
9781569905029

Overview

Scanning electron microscopy (SEM) is often used in plastics failure analysis when light microscopy cannot provide images of high enough resolution. SEM images also provide higher contrast, in particular of surface textures. SEM is also advantageous with very dark surfaces and transparent materials. This book is an unrivaled comprehensive collection of SEM images covering topics such as surface properties, adhesion, joining, fracture, and other types of failure of plastic parts, which are of decisive importance for the economic success of plastics manufacturing operations.

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