This book explores the design implications of emerging, non-volatile memory (NVM) technologies on future computer memory hierarchy architecture designs. Since NVM technologies combine the speed of SRAM, the density of DRAM, and the non-volatility of Flash memory, they are very attractive as the basis for future universal memories. This book provides a holistic perspective on the topic, covering modeling, design, architecture and applications. The practical information included in this book will enable designers to exploit emerging memory technologies to improve significantly the performance/power/reliability of future, mainstream integrated circuits.
- | Author: Yuan Xie, Yuan Xie
- | Publisher: Springer
- | Publication Date: Aug 23, 2016
- | Number of Pages: 328 pages
- | Language: English
- | Binding: Paperback/Technology & Engineering
- | ISBN-10: 1493941992
- | ISBN-13: 9781493941995
