Characterisation and Control of Defects in Semiconductors (Materials, Circuits and Devices)

This book provides an up-to-date review of the experimental and theoretical methods used for studying defects in semiconductors, this book focuses on recent developments driven by the requirements of new materials, including nitrides, oxide semiconductors and 2-D semiconductors.

• | Author: Filip Tuomisto, Filip Tuomisto
• | Publisher: The Institution of Engineering and Technology
• | Publication Date: Dec 16, 2019
• | Number of Pages: 596 pages
• | Language: English
• | Binding: Hardcover
• | ISBN-10: 1785616552
• | ISBN-13: 9781785616556