Overview
This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.
- | Author: Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert
- | Publisher: Springer
- | Publication Date: Jan 22, 2019
- | Number of Pages: 342 pages
- | Language: English
- | Binding: Hardcover
- | ISBN-10: 3319998242
- | ISBN-13: 9783319998244
