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Critical Phenomena at Surfaces and Interfaces: Evanescent X-Ray and Neutron Scattering

Critical Phenomena at Surfaces and Interfaces: Evanescent X-Ray and Neutron Scattering

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Product Details
Author:
Helmut Dosch
Publisher:
Springer
Publication Date:
Oct 03, 2013
Number of pages:
149 pages
Binding:
Paperback or Softback
ISBN-10:
3662149753
ISBN-13:
9783662149751

Overview

This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.


  • | Author: Helmut Dosch
  • | Publisher: Springer
  • | Publication Date: Oct 03, 2013
  • | Number of Pages: 149 pages
  • | Binding: Paperback or Softback
  • | ISBN-10: 3662149753
  • | ISBN-13: 9783662149751

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