Neutron and X-ray Reflectometry: Emerging Phenomena at Heterostructure Interfaces

Neutron and X-ray Reflectometry: Emerging Phenomena at Heterostructure Interfaces

Iop Publishing Ltd
SKU:
9780750346931
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ISBN13:
9780750346931
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Description
This book introduces the techniques of neutron and x-ray reflectometry and presents the studies carried out to date, using the techniques to understand emerging phenomena at the interfaces of thin films.


  • | Author: Saibal Basu, Surendra Singh
  • | Publisher: Iop Publishing Ltd
  • | Publication Date: Dec 27, 2022
  • | Number of Pages: 200 pages
  • | Language: English
  • | Binding: Hardcover
  • | ISBN-10: 0750346930
  • | ISBN-13: 9780750346931
Additional Information
Author:
Saibal Basu, Surendra Singh
Publisher:
Iop Publishing Ltd
Publication Date:
Dec 27, 2022
Number of pages:
200 pages
Language:
English
Binding:
Hardcover
ISBN-10:
0750346930
ISBN-13:
9780750346931
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