Neutron and X-ray Reflectometry: Emerging Phenomena at Heterostructure Interfaces

This book introduces the techniques of neutron and x-ray reflectometry and presents the studies carried out to date, using the techniques to understand emerging phenomena at the interfaces of thin films.

• | Author: Saibal Basu, Surendra Singh
• | Publisher: Iop Publishing Ltd
• | Publication Date: Dec 27, 2022
• | Number of Pages: 200 pages
• | Language: English
• | Binding: Hardcover
• | ISBN-10: 0750346930
• | ISBN-13: 9780750346931