Advancements in AI and IoT for Chip Manufacturing and Defect Prevention

This is essential reading for semiconductor professionals seeking to expand their knowledge on silicon processes, understand defect prevention, and explore optimizing processes by reducing defects using AI and IoT technologies. It charts a course where semiconductor manufacturing defects are minimized and maximizes productivity.

• | Author: Rupal Jain
• | Publisher: River Publishers
• | Publication Date: Nov 25, 2024
• | Number of Pages: 138 pages
• | Binding: Paperback or Softback
• | ISBN-10: 8770046816
• | ISBN-13: 9788770046817