Test Generation of Crosstalk Delay Faults in VLSI Circuits

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

• | Author: S. Jayanthy, M.C. Bhuvaneswari
• | Publisher: Springer
• | Publication Date: Oct 10, 2018
• | Number of Pages: 156 pages
• | Language: English
• | Binding: Hardcover
• | ISBN-10: 9811324921
• | ISBN-13: 9789811324925