Modern Interferometry For Length Metrology: Exploring Limits And Novel Techniques (Iph001)

Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology. Within the book advanced solutions, which can be used for various applications and can help provide a comprehensive understanding of both metrology and interferometry, have been developed and discussed.

• | Author: Rene Schodel
• | Publisher: Iop Publishing Ltd
• | Publication Date: Dec 21, 2018
• | Number of Pages: 350 pages
• | Language: English
• | Binding: Hardcover/Science
• | ISBN-10: 0750315768
• | ISBN-13: 9780750315760