Electrothermal Analysis of VLSI Systems

This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.

• | Author: Yi-Kan Cheng
• | Publisher: Springer
• | Publication Date: June 30, 2000
• | Number of Pages: 210 pages
• | Language: English
• | Binding: Hardcover
• | ISBN-10: 079237861X
• | ISBN-13: 9780792378617