Uncertainty Analysis For NIST Noise-Parameter Measurement

Some time ago, what is now the Electromagnetics Division of the National Institute of Standards and Technology (NIST) developed the capability to measure noise parameters of amplifiers [1,2]. Recently, modified methods and analysis have been developed and have been applied both to amplifiers [3] and to transistors [4], the latter in an on-wafer environment. For such measurements to be meaningful, the results must be accompanied by corresponding uncertainties.

• | Author: U. S. Department of Commerce
• | Publisher: Createspace Independent Publishing Platform
• | Publication Date: Jan 21, 2014
• | Number of Pages: 36 pages
• | Binding: Paperback or Softback
• | ISBN-10: 1494743973
• | ISBN-13: 9781494743970