Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
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Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

Wiley-ISTE
SKU:
9781786306401
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ISBN13:
9781786306401
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Description
  • | Author: Pierre-Richard Dahoo
  • | Publisher: Wiley-ISTE
  • | Publication Date: March 16, 2021
  • | Number of Pages: 256 pages
  • | Language: English
  • | Binding: Hardcover
  • | ISBN-10: 1786306409
  • | ISBN-13: 9781786306401
Additional Information
Author:
Pierre-Richard Dahoo
Publisher:
Wiley-ISTE
Publication Date:
March 16, 2021
Number of pages:
256 pages
Language:
English
Binding:
Hardcover
ISBN-10:
1786306409
ISBN-13:
9781786306401
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