Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method (Mechanical Enginnering and Solid Mechanics)
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Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method (Mechanical Enginnering and Solid Mechanics)

Wiley-ISTE
SKU:
9781786306876
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ISBN13:
9781786306876
$175.28 $165.76
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Description
  • | Author: Pierre-Richard Dahoo
  • | Publisher: Wiley-ISTE
  • | Publication Date: April 06, 2021
  • | Number of Pages: 288 pages
  • | Language: English
  • | Binding: Hardcover
  • | ISBN-10: 1786306875
  • | ISBN-13: 9781786306876
Additional Information
Author:
Pierre-Richard Dahoo
Publisher:
Wiley-ISTE
Publication Date:
April 06, 2021
Number of pages:
288 pages
Language:
English
Binding:
Hardcover
ISBN-10:
1786306875
ISBN-13:
9781786306876
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