Long-Term Reliability of Nanometer VLSI Systems : Modeling, Analysis and Optimization
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Long-Term Reliability of Nanometer VLSI Systems : Modeling, Analysis and Optimization

Springer
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9783030261740
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ISBN13:
9783030261740
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Description
  • | Author: Sheldon X. D. Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr
  • | Publisher: Springer
  • | Publication Date: Sep 25, 2020
  • | Number of Pages: 501 pages
  • | Language: English
  • | Binding: Paperback
  • | ISBN-10: 3030261743
  • | ISBN-13: 9783030261740
Additional Information
Author:
Sheldon X. D. Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr
Publisher:
Springer
Publication Date:
Sep 25, 2020
Number of pages:
501 pages
Language:
English
Binding:
Paperback
ISBN-10:
3030261743
ISBN-13:
9783030261740
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