Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals and Their Dynamics

Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing. The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.

• | Author: Henning Friis Poulsen
• | Publisher: Springer
• | Publication Date: Oct 03, 2013
• | Number of Pages: 156 pages
• | Binding: Paperback or Softback
• | ISBN-10: 366214543X
• | ISBN-13: 9783662145432